Ceit development s the development of more reliable chips for mission-critical applications within the SoC4CRIS-II project

project 's SoC4CRIS-II project has reached one of its major technological milestones with the development of an experimental chip based on the open RISC-V architecture, designed in the Basque Country and manufactured in Europe. In this collaborative initiative, Ceit has contributed to the development of technologies aimed at increasing the robustness and reliability of electronic systems—a capability that is becoming increasingly important in strategic industrial sectors.

Funded by the Basque Government’s Elkartek program and led by theAPERT group t at the University of the Basque Country (EHU), the project brings together various stakeholders from the Basque innovation ecosystem with the goal to advance the design of microelectronic systems that are more resilient and less dependent on proprietary technologies.

Fault-tolerant electronics

Ceit 's contribution has focused on integrating error-mitigation mechanisms into report and critical logic based on a RISC-V architecture developed by the center itself.

To this end, the researchers have incorporated various fault-tolerance techniques, including error detection and correction (EDAC) systems, scrubbing, and triple modular redundancy (TMR), which make it possible to detect, correct, or mitigate errors that may occur during the operation of an electronic system.

These solutions have been implemented and validated on FPGA platforms through simulation and assessment in various operating scenarios.

In addition to demonstrating their effectiveness in test environments, the developments undertaken are intended for future transfer to application-specific integrated circuits (ASICs), a technology widely used in sectors where security, availability , and reliability are requirements essential.

knowledge applied to industry

Electronic systems used in fields such as energy, space, mobility , and advanced manufacturing must continue to function even when errors occur due to interference, radiation, or demanding operating conditions.

The advancements developed by Ceit as part of SoC4CRIS-II help address this challenge through solutions that increase the resilience of electronic devices from the earliest stages of design.

project also highlights the Basque ecosystem’s ability to generate knowledge in strategic areas such as microelectronics and translate it into applications with potential industrial impact. SoC4CRIS-II is led by the University of the Basque Country (EHU) and involves the participation of Ceit, Ikerlan, Tekniker, Tecnalia, Connect Group, and the GAIA-BMH cluster .